Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling
Muresan, Valentin, Wang, Xiaojun, Muresan, Valentina and Vladutiu, M.
(2000)
Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling.
In: ATS 2000 - 9th Asian Test Symposium, 4-6 December 2000, Taipei, Taiwan.
ISBN 0-7695-0887-1
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm.
Metadata
Item Type:
Conference or Workshop Item (Paper)
Event Type:
Conference
Refereed:
Yes
Uncontrolled Keywords:
VLSI; automatic test pattern generation; fault diagnosis; high level synthesis; integrated circuit testing; least mean squares methods; logic testing; scheduling; trees (mathematics);