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Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling

Muresan, Valentin and Wang, Xiaojun and Muresan, Valentina and Vladutiu, M. (2000) Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling. In: ATS 2000 - 9th Asian Test Symposium, 4-6 December 2000, Taipei, Taiwan. ISBN 0-7695-0887-1

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A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm.

Item Type:Conference or Workshop Item (Paper)
Event Type:Conference
Uncontrolled Keywords:VLSI; automatic test pattern generation; fault diagnosis; high level synthesis; integrated circuit testing; least mean squares methods; logic testing; scheduling; trees (mathematics);
Subjects:Engineering > Electronic engineering
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Engineering and Computing > School of Electronic Engineering
Published in:Proceedings of the 9th Asian Test Symposium. . Institute of Electrical and Electronics Engineers. ISBN 0-7695-0887-1
Publisher:Institute of Electrical and Electronics Engineers
Official URL:
Copyright Information:©2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
ID Code:15538
Deposited On:22 Jul 2010 13:43 by DORAS Administrator. Last Modified 02 Nov 2016 16:32

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