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Sulfur-induced c(4×4) reconstruction of the Si(001) surface studied by scanning tunneling microscopy

Moriarty, P. and Koenders, L. and Hughes, Greg (1993) Sulfur-induced c(4×4) reconstruction of the Si(001) surface studied by scanning tunneling microscopy. Physical Review B, 47 (23). pp. 15950-15953. ISSN 0163-1829

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Abstract

Scanning tunneling microscopy and low-energy electron diffraction have been used to study the adsorption and subsequent thermal desorption of molecular sulfur from the Si(001) surface. Room-temperature adsorption of sulfur resulted in the formation of an overlayer, displaying a high density of vacancies or defects, with the underlying Si(001) surface retaining the (2×1) reconstruction. Annealing this surface to 325 °C leads to the desorption of the sulfur overlayer and the appearance of coexisting c(4×4) and (2×1) surface reconstructions. Our data suggest that the c(4×4) reconstruction is an adsorbate-induced structure in which the sulfur creates defects during the desorption process. High-resolution filled- and empty-state images of the c(4×4) surface lead us to propose a missing-dimer defect model for this reconstruction.

Item Type:Article (Published)
Refereed:Yes
Subjects:Physical Sciences > Physics
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Publisher:The American Physical Society
Official URL:http://dx.doi.org/10.1103/PhysRevB.47.15950
Copyright Information:© 1993 The American Physical Society
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:15598
Deposited On:03 Aug 2010 16:12 by DORAS Administrator. Last Modified 03 Aug 2010 16:12

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