Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses
Radcliffe, P. and Düsterer, S. and Azima, A. and Redlin, H. and Feldhaus, J. and Dardis, John and Kavanagh, Kevin D. and Luna, H. and Pedregosa-Gutierrez, Jofre and Yeates, Patrick and Kennedy, Eugene T. and Costello, John T. and Delserieys, A. and Lewis, C.L.S. and Taïeb, R. and Maquet, A. and Cubaynes, D. and Meyer, M. (2007) Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses. Applied Physics Letters, 90 (13). pp. 131108-1. ISSN 0003-6951
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Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.
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