Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses
Dardis, John and Kavanagh, Kevin D. and Pedregosa-Gutierrez, Jofre and Yeates, Pat and Kennedy, Eugene T. and Costello, John T. (2007) Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses. Applied Physics Letters, 90 (13). ISSN 0003-6951
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Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization
between individual pulses of the femtosecond extreme ultraviolet (XUV) Free electron
LASer in Hamburg and an independent intense 120 fs mode-locked Ti:Sa laser. Characteristic sidebands
appear in the photoelectron spectra when the two pulses overlap spatially and temporally.
The cross-correlation curve points to a 250 fs r.m.s. jitter between the two sources at the experiment.
A more precise determination of the temporal fluctuation between the XUV and infrared
pulses is obtained through the analysis of the single-shot sideband intensities.
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