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Author: Äyräs, P.

Number of items: 1.

1996

McNally, Patrick J. and Tuomi, T. and Herbert, P.A.F. and Baric, Adrijan and Äyräs, P. and Karilahti, M. and Lipsanen, H. and Tromby, M. (1996) Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's. IEEE Transactions on Electron Devices, 43 (7). pp. 1085-1091. ISSN 1085-1091

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