Number of items: 3.
Allen, David (2014) Analysis of silicon wafer damage due to nanoindentation by microraman spectroscopy and white beam synchrotron X-ray toporaphy. PhD thesis, Dublin City University.
Allen, David and Stopford, Jennifer and Wittge, Jochen and Danilewsky, Andreas and McNally, Patrick J. (2011) Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon. Journal Of Applied Crystallography, 44 (3). pp. 526-531. ISSN 0021-8898
Allen, David and Wittge, Jochen and Zlotos, A. and Gorogostegui-Coinas, E. and Garagorri, J. and McNally, Patrick J. and Danilewsky, A.N. and Elizalde, M.R. (2010) Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-raman spectroscopy and white beam x-ray topography. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 268 (3-4). pp. 383-387. ISSN 0168-583x