Number of items: 3.
O'Reilly, Lisa and Horan, Ken and McNally, Patrick J. and Bennett, N.S. and Cowern, N.E.B. and Lankinen, Aapo and Sealy, B.J. and Gwilliam, R.M. and Noakes, T.C.Q. and Bailey, P. (2008) Constraints on micro-Raman strain metrology for highly doped strained Si materials. Applied Physics Letters, 92 (23). ISSN 1077-3118
Cherkaoui, K. and Monaghan, S. and Negara, M.A. and Modreanu, M. and Hurley, P.K. and O’Connell, Deborah and McDonnell, Stephen and Hughes, Greg and Wright, S. and Barklie, R.C. and Bailey, P. and Noakes, T.C.Q. (2008) Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation. Journal of Applied Physics, 104 (6). 064113-1. ISSN 0021-8979
Moriarty, Philip and Murphy, B. and Roberts, L. and Cafolla, Attilio A. and Hughes, Greg and Koenders, L. and Bailey, P. (1994) Photoelectron core-level spectroscopy and scanning-tunneling-microscopy study of the sulfur-treated GaAs(100) surface. Physical Review B, 50 (19). p. 14237. ISSN 0163-1829