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Author: Danilewsky, Andreas

Number of items: 1.

2011

Allen, David and Stopford, Jennifer and Wittge, Jochen and Danilewsky, Andreas and McNally, Patrick J. (2011) Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon. Journal Of Applied Crystallography, 44 (3). pp. 526-531. ISSN 0021-8898

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