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Author: Domagala, J.

Number of items: 1.


Rantamäki, R. and Tuomi, T. and Zytkiewicz, Z.R. and Domagala, J. and McNally, Patrick J. (1999) Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers. Journal of Applied Physics, 86 (8). ISSN 0021-8979

This list was generated on Sat Feb 24 03:04:39 2018 GMT.