1999

Rantamäki, R., Tuomi, Tiinamaija, Zytkiewicz, Z.R., Domagala, J. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (1999) Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers. Journal of Applied Physics, 86 (8). ISSN 0021-8979