Number of items: 4.
Dewan, M.N.A. and McNally, Patrick J. and Herbert, P.A.F. (2002) Plasma modeling for a nonsymmetric capacitive discharge driven by a nonsinusoidal radio frequency current. Journal of Applied Physics, 91 (9). ISSN 0021-8979
McNally, Patrick J. and Rantamäki, R. and Tuomi, T. and Danilewsky, A.N. and Lowney, Donnacha and Curley, John W. and Herbert, P.A.F. (2001) Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam x-ray topography. IEEE Transactions on Components and Packaging Technologies, 24 (1). pp. 76-83. ISSN 1521-3331
McNally, Patrick J. and Tuomi, T. and Herbert, P.A.F. and Baric, Adrijan and Äyräs, P. and Karilahti, M. and Lipsanen, H. and Tromby, M. (1996) Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's. IEEE Transactions on Electron Devices, 43 (7). pp. 1085-1091. ISSN 1085-1091
McNally, Patrick J. and Herbert, P.A.F. and Tuomi, T. and Karilahti, M. and Higgins, J.A. (1996) Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs-based power varactor diodes. Journal of Applied Physics, 79 (11). ISSN 0021-8979