Number of items: 3.
Horan, Ken and Lankinen, Aapo and O'Reilly, Lisa and Bennett, N.S. and McNally, Patrick J. and Sealy, B.J. and Cowern, N.E.B. and Tuomi, T. (2008) Structural and electrical characterisation of ion-implanted strained silicon. Materials Science and Engineering: B, 154-155 . pp. 118-121. ISSN 0921-5107
O'Reilly, Lisa and Horan, Ken and McNally, Patrick J. and Bennett, N.S. and Cowern, N.E.B. and Lankinen, Aapo and Sealy, B.J. and Gwilliam, R.M. and Noakes, T.C.Q. and Bailey, P. (2008) Constraints on micro-Raman strain metrology for highly doped strained Si materials. Applied Physics Letters, 92 (23). ISSN 1077-3118
O'Reilly, Lisa and Mitra, Anirban and Lucas, Francis Olabanji and Natarajan, Gomathi and McNally, Patrick J. and Daniels, Stephen and Lankinen, Aapo and Lowney, Donnacha and Bradley, Ann Louise and Cameron, David C. (2007) Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications. Journal of Materials Science: Materials in Electronics, 18 (1). pp. 57-60. ISSN 1573-482X