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Wong, Chiu Soon, Bennett, N.S., McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121, Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M., Monaghan, S., Hurley, Paul K. orcid logoORCID: 0000-0001-5137-721X and Cherkaoui, K. (2010) Multi-technique characterisation of MOVPE-grown GaAs on Si. Microelectronic Engineering, 88 (4). pp. 472-475. ISSN 0167-9317


Miranda, E., O'Connor, E., Cherkaoui, K., Monaghan, S., Long, R., O'Connell, Deborah, Hurley, Paul K. orcid logoORCID: 0000-0001-5137-721X, Hughes, Greg orcid logoORCID: 0000-0003-1310-8961 and Casey, Patrick (2009) Electrical characterization of the soft breakdown failure mode in MgO layers. Applied Physics Letters, 95 (1). 012901-1. ISSN 0003-6951


Cherkaoui, K., Monaghan, S., Negara, M.A., Modreanu, M., Hurley, Paul K. orcid logoORCID: 0000-0001-5137-721X, O'Connell, Deborah, McDonnell, Stephen, Hughes, Greg orcid logoORCID: 0000-0003-1310-8961, Wright, S., Barklie, R.C., Bailey, P. and Noakes, T.C.Q. (2008) Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation. Journal of Applied Physics, 104 (6). 064113-1. ISSN 0021-8979

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