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Author: O'Connor, Robert

Number of items: 3.


O'Connor, Robert and Hughes, Greg and Casey, Patrick and Newcomb, Simon B. (2010) Degradation and breakdown characteristics of thin MgO dielectric layers. Journal of Applied Physics, 107 (2). 024501-024504. ISSN 0021-8979

O'Connor, Robert and Hughes, Greg and Kauerauf, Thomas and Ragnarsson, Lars-Ake (2010) Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS. In: 2010 IEEE International Reliability Physics Symposium, 2-6 May 2010, Anaheim, CA, USA. ISBN 978-1-4244-5430-3


O'Connor, Robert (2005) Electrical and chemical characterisation of ultrathin transistor gate dielectric layers. PhD thesis, Dublin City University.

This list was generated on Thu Apr 19 07:17:02 2018 IST.