Browse by Author
 | Up a level |
Group by: Date | No Grouping
Jump to: 2010
Number of items: 1.
2010
O'Connor, Robert 
ORCID: 0000-0001-5794-6188, Hughes, Greg ORCID: 0000-0003-1310-8961, Kauerauf, Thomas and Ragnarsson, Lars-Ake
(2010)
Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS.
In: 2010 IEEE International Reliability Physics Symposium, 2-6 May 2010, Anaheim, CA, USA.
ISBN 978-1-4244-5430-3