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2010

O'Connor, Robert orcid logoORCID: 0000-0001-5794-6188, Hughes, Greg orcid logoORCID: 0000-0003-1310-8961, Kauerauf, Thomas and Ragnarsson, Lars-Ake (2010) Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS. In: 2010 IEEE International Reliability Physics Symposium, 2-6 May 2010, Anaheim, CA, USA. ISBN 978-1-4244-5430-3

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