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Tanner, Brian K. 
ORCID: 0000-0002-1474-177X, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Roarty, Billy, Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121
(2019)
In-operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices.
Microelectronics Reliability, 99
.
pp. 232-238.
ISSN 0026-2714