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Jump to: 2019
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Tanner, Brian K. orcid logoORCID: 0000-0002-1474-177X, Vijayaraghavan, Rajani K. orcid logoORCID: 0000-0003-1096-448X, Roarty, Billy, Danilewsky, Andreas N. and McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121 (2019) In-operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices. Microelectronics Reliability, 99 . pp. 232-238. ISSN 0026-2714

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