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Author: Wong, Chiu Soon

Number of items: 4.

2014

Wong, Chiu Soon and Bennett, N.S. and Manessis, D. and Danilewsky, Andreas N. and McNally, Patrick J. (2014) Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages. Microelectronic Engineering, 117 . pp. 48-56. ISSN 0167-9317

2013

Wong, Chiu Soon (2013) X-ray diffraction techniques for future advanced CMOS metrology challenges. PhD thesis, Dublin City University.

2012

Wong, Chiu Soon and Bennett, N.S. and Galiana, B. and Tejedor, P. and Benedicto, M. and Molina-Aldareguia, J.M. and McNally, Patrick J. (2012) Structural investigation of MOVPE-Grown GaAs on Ge by X-ray techniques. Semiconductor Science and Technology, 27 (11). p. 115012. ISSN 0268-1242

2010

Wong, Chiu Soon and Bennett, N.S. and McNally, Patrick J. and Galiana, B. and Tejedor, P. and Benedicto, M. and Molina-Aldareguia, J.M. and Monaghan, S. and Hurley, P.K. and Cherkaoui, K. (2010) Multi-technique characterisation of MOVPE-grown GaAs on Si. Microelectronic Engineering, 88 (4). pp. 472-475. ISSN 0167-9317

This list was generated on Sun Aug 20 08:24:20 2017 IST.