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Jump to: 1999
Number of items: 1.

1999

Rantamäki, R., Tuomi, Tiinamaija, Zytkiewicz, Z.R., Domagala, J. and McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121 (1999) Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers. Journal of Applied Physics, 86 (8). ISSN 0021-8979

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