Optical beam guidance in monolithic polymer chips for miniaturized colorimetric assays
Grumann, M., Moser, I., Steigert, J., Riegger, L., Geipel, A., Kohn, C., Urban, G., Zengerle, Roland and Ducrée, JensORCID: 0000-0002-0366-1897
(2005)
Optical beam guidance in monolithic polymer chips for miniaturized colorimetric assays.
In: MEMS 2005 - 18th IEEE International Conference on Micro Electro Mechanical Systems, 30 January - 3 February 2005, Miami, FL, USA.
ISBN 0-7803-8732-5
For the first time, we present a simple and robust optical concept to enable precise and sensitive read-out of colorimetric assays in flat lab-on-a-chip devices. The optical guidance of the probe beam through an incorporated measurement chamber to the detector is based on the total internal reflection at V-grooves in the polymer chip. This way, the optical path length through the flat measurement chamber and thus the performance of the measurements are massively enhanced compared to direct (perpendicular) beam incidence. This is demonstrated by a chip-based, colorimetric glucose-assay on serum. Outstanding features are an excellent reproducibility (CV= 1.91 %), a competitive lower limit of detection (cmin = 124 μM), and a high degree of linearity (R2 = 0.998) within a working range extending over nearly three orders of magnitude.
Proceedings of the 18th IEEE International Conference on Micro Electro Mechanical Systems, 2005.
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Institute of Electrical and Electronics Engineers. ISBN 0-7803-8732-5