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Number of items: 2.
2008
O'Reilly, Lisa, Horan, Ken, McNally, Patrick J. 
ORCID: 0000-0003-2798-5121, Bennett, N.S., Cowern, N.E.B., Lankinen, Aapo, Sealy, B.J., Gwilliam, R.M., Noakes, T.C.Q. and Bailey, P.
(2008)
Constraints on micro-Raman strain metrology for highly doped strained Si materials.
Applied Physics Letters, 92
(23).
ISSN 1077-3118
2006
Bennett, N.S., Cowern, N.E.B., Smith, A.J., Gwilliam, R.M., Sealy, B.J., O'Reilly, Lisa, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Cooke, G. and Kheyrandish, H.
(2006)
Highly conductive Sb-doped layers in strained Si.
Applied Physics Letters, 89
(18).
ISSN 0003-6951