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Caffrey, David orcid logoORCID: 0000-0001-7870-4428, Zhussupbekova, Ainur orcid logoORCID: 0000-0003-2724-8762, Vijayaraghavan, Rajani K. orcid logoORCID: 0000-0003-1096-448X, Ainabayev, Ardak, Kaisha, Aitkazy orcid logoORCID: 0000-0001-7203-9842, Sugurbekova, Gulnar orcid logoORCID: 0000-0002-6894-7247, Shvets, Igor V. orcid logoORCID: 0000-0001-7451-5435 and Fleischer, Karsten orcid logoORCID: 0000-0002-7638-4480 (2020) Crystallographic characterisation of ultra-thin, or amorphous transparent conducting oxides:the case for raman spectroscopy. Materials, 13 (2). pp. 1-14. ISSN 1996-1944

Mauit, Ozhet, Caffrey, David orcid logoORCID: 0000-0001-7870-4428, Ainabayev, Ardak, Kaisha, Aitkazy orcid logoORCID: 0000-0001-7203-9842, Toktarbaiuly, Olzat, Sugurbekov, Yerzhigit, Sugurbekova, Gulnar orcid logoORCID: 0000-0002-6894-7247, Shvets, Igor V. orcid logoORCID: 0000-0001-7451-5435 and Fleischer, Karsten orcid logoORCID: 0000-0002-7638-4480 (2019) Growth of ZnO:Al by atomic layer deposition: deconvoluting the contribution of hydrogen interstitials and crystallographic texture on the conductivity. Thin Solid Films, 690 . ISSN 0040-6090

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