Login (DCU Staff Only)
Login (DCU Staff Only)

DORAS | DCU Research Repository

Explore open access research and scholarly works from DCU

Advanced Search

Browse by Author

[up] Up a level
[Atom feed] Atom [RSS feed] RSS 1.0 [RSS2 feed] RSS 2.0
Group by: Date | No Grouping
Jump to: 2010
Number of items: 1.

2010

O'Connor, Robert orcid logoORCID: 0000-0001-5794-6188, Hughes, Greg orcid logoORCID: 0000-0003-1310-8961, Kauerauf, Thomas and Ragnarsson, Lars-Ake (2010) Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS. In: 2010 IEEE International Reliability Physics Symposium, 2-6 May 2010, Anaheim, CA, USA. ISBN 978-1-4244-5430-3

This list was generated on Sat Dec 21 16:13:38 2024 UTC.