Login (DCU Staff Only)
Login (DCU Staff Only)

DORAS | DCU Research Repository

Explore open access research and scholarly works from DCU

Advanced Search

Browse by Author

[up] Up a level
[Atom feed] Atom [RSS feed] RSS 1.0 [RSS2 feed] RSS 2.0
Group by: Date | No Grouping
Jump to: 2019
Number of items: 1.

2019

Tanner, Brian K. orcid logoORCID: 0000-0002-1474-177X, Vijayaraghavan, Rajani K. orcid logoORCID: 0000-0003-1096-448X, Roarty, Billy, Danilewsky, Andreas N. and McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121 (2019) In-operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices. Microelectronics Reliability, 99 . pp. 232-238. ISSN 0026-2714

This list was generated on Fri Dec 20 20:00:57 2024 UTC.