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Tanner, Brian K orcid logoORCID: 0000-0002-1474-177X, Danilewsky, Andreas and McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121 (2022) X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions. Journal of Applied Crystallography, 55 . pp. 1139-1146. ISSN 0021-8898

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