2014

Wong, Chiu Soon, Bennett, N.S., Manessis, D., Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2014) Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages. Microelectronic Engineering, 117 . pp. 48-56. ISSN 0167-9317

2013

Wong, Chiu Soon (2013) X-ray diffraction techniques for future advanced CMOS metrology challenges. PhD thesis, Dublin City University.

2012

Wong, Chiu Soon, Bennett, N.S., Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2012) Structural investigation of MOVPE-Grown GaAs on Ge by X-ray techniques. Semiconductor Science and Technology, 27 (11). p. 115012. ISSN 0268-1242

2010

Wong, Chiu Soon, Bennett, N.S., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M., Monaghan, S., Hurley, Paul K. ORCID: 0000-0001-5137-721X and Cherkaoui, K. (2010) Multi-technique characterisation of MOVPE-grown GaAs on Si. Microelectronic Engineering, 88 (4). pp. 472-475. ISSN 0167-9317