Cherkaoui, K., Monaghan, S., Negara, M.A., Modreanu, M., Hurley, Paul K. 
ORCID: 0000-0001-5137-721X, O'Connell, Deborah, McDonnell, Stephen, Hughes, Greg ORCID: 0000-0003-1310-8961, Wright, S., Barklie, R.C., Bailey, P. and Noakes, T.C.Q.
(2008)
Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation.
Journal of Applied Physics, 104
(6).
064113-1.
ISSN 0021-8979
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