1996

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Tuomi, Tiinamaija, Herbert, P.A.F., Baric, Adrijan, Äyräs, P., Karilahti, M., Lipsanen, H. and Tromby, M. (1996) Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's. IEEE Transactions on Electron Devices, 43 (7). pp. 1085-1091. ISSN 1085-1091

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Herbert, P.A.F., Tuomi, Tiinamaija, Karilahti, M. and Higgins, J.A. (1996) Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs-based power varactor diodes. Journal of Applied Physics, 79 (11). ISSN 0021-8979