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Influence of cavity lifetime on high-finesse microcavity two-photon absorption photodetectors

Guo, Wei Hua, O'Dowd, John, Lynch, Michael, Bradley, Ann Louise orcid logoORCID: 0000-0002-9399-8628, Donegan, John Francis orcid logoORCID: 0000-0002-5240-1434 and Barry, Liam P. orcid logoORCID: 0000-0001-8366-4790 (2007) Influence of cavity lifetime on high-finesse microcavity two-photon absorption photodetectors. IEEE Photonics Technology Letters, 19 (6). pp. 432-434. ISSN 1041-1135

Abstract
For optical pulse incidence as compared with continuous-wave incidence, the enhancement of two-photon absorption inside a high-finesse planar microcavity is reduced, the pulse inside the cavity and the cavity spectrum are broadened. The analysis shows that for transform-limited pulse incidence, the true pulsewidth and the cavity frequency resolution can be estimated if the cavity lifetime or the cavity bandwidth has been obtained from the reflection or transmission spectrum of the cavit.
Metadata
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:autocorrelation; finesse; microcavity; photodetector; two-photon absorption (TPA);
Subjects:Engineering > Optical communication
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Engineering and Computing > School of Electronic Engineering
Research Institutes and Centres > Research Institute for Networks and Communications Engineering (RINCE)
Publisher:Institute of Electrical and Electronics Engineers
Official URL:http://dx.doi.org/10.1109/LPT.2007.892884
Copyright Information:Copyright © 2007 IEEE. Reprinted from IEEE Photonics Technology Letters.This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the Dublin City University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
ID Code:162
Deposited On:28 Jan 2008 by DORAS Administrator . Last Modified 28 Aug 2020 11:43
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