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Which pattern? Biasing aspects of planar calibration patterns and detection methods

Mallon, John and Whelan, Paul F. orcid logoORCID: 0000-0001-9230-7656 (2007) Which pattern? Biasing aspects of planar calibration patterns and detection methods. Pattern Recognition Letters, 28 (8). pp. 921-930. ISSN 0167-8655

This paper provides a comparative study on the use of planar patterns in the generation of control points for camera calibration. This is an important but often neglected aspect in camera calibration. Two popular checkerboard and circular dot patterns are each examined with two detection strategies for invariance to the potential bias from projective transformations and nonlinear distortions. It is theoretically and experimentally shown that circular patterns can potentially be affected by both biasing sources. Guidelines are given to control such bias. In contrast, appropriate checkerboard detection is shown to be bias free. The findings have important implications for camera calibration, indicating that well accepted methods may give poorer results than necessary if applied naively.
Item Type:Article (Published)
Uncontrolled Keywords:computer vision; image analysis; Camera calibration; Calibration patterns; Bias compensation; Lens distortion
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Engineering and Computing > School of Electronic Engineering
Official URL:http://dx.doi.org/10.1016/j.patrec.2006.12.008
Copyright Information:© 2007 Elsevier
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:18667
Deposited On:14 Aug 2013 11:07 by Mark Sweeney . Last Modified 17 Jan 2019 12:56

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