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Multiphoton single and double ionization of neon in the EUV

Durkan, Stephen M., Richardson, Vincent, Forembski, Andrew, Varvarezos, Lazaros orcid logoORCID: 0000-0002-6781-6616, Cubaynes, Denis orcid logoORCID: 0009-0005-7019-3156, Düsterer, Stefan, Juranić, Pavle, Li, Wenbin, Richter, Mathias, Tiedtke, Kai, Meyer, Michael, Nikolopoulos, L .A .A and Costello, John T. orcid logoORCID: 0000-0003-4677-9999 (2024) Multiphoton single and double ionization of neon in the EUV. Journal of Physics B: Atomic, Molecular and Optical Physics, 58 (1). pp. 1361-6455. ISSN 1361-6455

New information demonstrating the importance of both sequential and simultaneous (or direct) multiphoton ionization of inner shell electrons from neon is discussed in this paper. Ne was irradiated with intense 93 eV free electron laser (FEL) pulses at FLASH and studied with the aid of photoelectron spectrometry. This resulted in two and three photon, single and double ionization of neon, removing electrons from 2s and 2p subshells of the neutral Ne atom in multiple different pathways. The spectral features of the photoelectrons were identified through comparison with the NIST database and field averaged time-dependent density matrix theory. The calculations show the direct multiphoton ionization processes to be extremely sensitive to the focused FEL intensity.
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:Multiphoton ionisation, free electron laser, photoelectron spectroscopy
Subjects:Computer Science > Computer engineering
Computer Science > Computer software
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Science and Health
DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Research Institutes and Centres > National Centre for Plasma Science and Technology (NCPST)
Publisher:Institute of Physics Publishing Ltd.
Official URL:https://iopscience.iop.org/article/10.1088/1361-64...
Copyright Information:Authors
ID Code:30833
Deposited On:25 Mar 2025 12:20 by Gordon Kennedy . Last Modified 25 Mar 2025 12:20

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