Allen, David (2014) Analysis of silicon wafer damage due to nanoindentation by microraman spectroscopy and white beam synchrotron X-ray toporaphy. PhD thesis, Dublin City University.
Allen, David, Stopford, Jennifer, Wittge, Jochen, Danilewsky, Andreas N. and McNally, Patrick J. 
ORCID: 0000-0003-2798-5121
(2011)
Three-dimensional X-ray diffraction imaging of
process-induced dislocation loops in silicon.
Journal Of Applied Crystallography, 44
(3).
pp. 526-531.
ISSN 0021-8898
Allen, David, Wittge, Jochen, Zlotos, A., Gorogostegui-Coinas, E., Garagorri, J., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Danilewsky, Andreas N. and Elizalde, M.R.
(2010)
Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-raman spectroscopy and white beam x-ray topography.
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 268
(3-4).
pp. 383-387.
ISSN 0168-583x
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