1998

Baric, Adrijan and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (1998) A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior. IEEE Transactions on Education, 41 (3). pp. 219-223. ISSN 0018-9359

1996

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Tuomi, Tiinamaija, Herbert, P.A.F., Baric, Adrijan, Äyräs, P., Karilahti, M., Lipsanen, H. and Tromby, M. (1996) Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's. IEEE Transactions on Electron Devices, 43 (7). pp. 1085-1091. ISSN 1085-1091

1995

Baric, Adrijan (1995) Simulation of the impact of stress induced piezoelectric charge in GaAs MESFETs. PhD thesis, Dublin City University.