Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses
Radcliffe, P., Düsterer, S., Azima, A., Redlin, H., Feldhaus, J., Dardis, John, Kavanagh, Kevin D., Luna, H., Pedregosa-Gutierrez, JofreORCID: 0000-0001-7527-4522, Yeates, PatrickORCID: 0000-0002-6734-0590, Kennedy, Eugene T.ORCID: 0000-0002-0710-5281, Costello, John T.ORCID: 0000-0003-4677-9999, Delserieys, A., Lewis, C.L.S., Taïeb, R., Maquet, A., Cubaynes, D. and Meyer, M.
(2007)
Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses.
Applied Physics Letters, 90
(13).
pp. 131108-1.
ISSN 0003-6951
Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.
Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://dx.doi.org/10.1063/1.2716360 .
Funders:
Science Foundation Ireland, Higher Education Authority
ID Code:
15631
Deposited On:
06 Aug 2010 10:29 by
DORAS Administrator
. Last Modified 07 Oct 2021 12:43