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Uniaxial stress and Zeeman spectroscopy of the 3.324 eV Ge-related photoluminescence in ZnO

Cullen, Joseph, Johnston, K., McGlynn, Enda orcid logoORCID: 0000-0002-3412-9035, Henry, Martin O., Dunker, D., Yakovlev, D.R. and Bayer, M. (2013) Uniaxial stress and Zeeman spectroscopy of the 3.324 eV Ge-related photoluminescence in ZnO. Physical Review B (PRB), 87 (16). p. 165202. ISSN 1098-0121

Abstract
Recently observed photoluminescence (PL) in ZnO, positioned at 3.324 eV and known to be related to Ge impurities, is investigated here by uniaxial stress and Zeeman spectroscopy measurements. The 3.324 eV PL line shifts but does not split under uniaxial stress both parallel and perpendicular to the c-axis, indicating trigonal defect symmetry. This reinforces the findings of prior work that the defect centre is related to a substitutional Ge impurity in ZnO. Applied magnetic fields result in linear splittings of the line into two components for fields parallel and perpendicular to the c-axis. This result combined with the temperature dependence of the Zeeman spectra enables the line to be assigned to neutral donor bound exciton recombination. Some possible models for the defect are considered.
Metadata
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:Photoluminescence (PL) in ZnO
Subjects:Physical Sciences > Physics
Physical Sciences > Photonics
Physical Sciences > Semiconductors
DCU Faculties and Centres:Research Institutes and Centres > National Centre for Plasma Science and Technology (NCPST)
DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Publisher:American Physical Society
Official URL:http://dx.doi.org/10.1103/PhysRevB.87.165202
Copyright Information:© 2013 APS
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:19603
Deposited On:21 Oct 2013 15:39 by Enda Mcglynn . Last Modified 19 Mar 2019 14:30
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