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Surface characterization of Poly 2-Vinylpyridine - a polymer for area selective deposition techniques

Snelgrove, Matthew orcid logoORCID: 0000-0003-0344-1146, Zehe, Clara, Lundy, Ross orcid logoORCID: 0000-0002-1329-8614, Yadav, Pravind orcid logoORCID: 0000-0002-2535-7132, Rueff, Jean-Pascal orcid logoORCID: 0000-0003-3594-918X, O'Connor, Robert orcid logoORCID: 0000-0001-5794-6188, Bogan, Justin, Hughes, Greg orcid logoORCID: 0000-0003-1310-8961, McGlynn, Enda orcid logoORCID: 0000-0002-3412-9035, Morris, Michael A. and Mani-González, Pierre Giovanni orcid logoORCID: 0000-0001-6993-2349 (2019) Surface characterization of Poly 2-Vinylpyridine - a polymer for area selective deposition techniques. Journal of Vacuum Science & Technology A, 37 (5). ISSN 0734-2101

Thin films of OH terminated poly-2-vinylpyridine (P2VP-OH), a polymer with potential for infiltration mediated thin film deposition, area selective deposition (ASD) and small feature size development via block copolymer (BCP) self-assembly, has been studied with hard X-Ray photoelectron spectroscopy (HAXPES). From the N 1s and C 1s core level spectra, accurate values for the binding energy positions of the species present in the films were obtained, providing clear evidence for signals associated to pyridine bonds. The aromatic ring on the P2VP side chain is clearly identified in the studied core levels. These observations allow for a complete understanding of the chemical environment of the polymer and provide evidence of the potential reactions that can occur with metal diffusion into P2VP. Transmission Electron Microscopy (TEM), Attenuated Total Reflection Infrared Spectroscopy (ATR IR) and Atomic Force Microscopy (AFM) measurements reveal high quality films and this work provides a reference base for this functional material in terms of its utility for ASD, BCP and subsequent atomic layer deposition (ALD) based polymer infiltration processes.
Item Type:Article (Published)
Uncontrolled Keywords:Poly 2-Vinylpyridine; P2VP; Polymer; Area Selective Deposition
Subjects:Engineering > Materials
Physical Sciences > Nanotechnology
Physical Sciences > Spectrum analysis
Physical Sciences > Thin films
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Research Institutes and Centres > National Centre for Plasma Science and Technology (NCPST)
Publisher:American Vacuum Society
Official URL:http://dx.doi.org/10.1116/1.5115769
Copyright Information:© 2019 American Vacuum Society
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
Funders:Science Foundation Ireland (grants 12/RC/2278 and 16/SP/3809), CONACyT fund 2018-000007-01EXTV-00235, GALAXIES beamline with approval from SOLEIL (proposal number 20180106)
ID Code:23647
Deposited On:19 Aug 2019 11:50 by Enda Mcglynn . Last Modified 28 Nov 2023 12:14

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