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Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses

Dardis, John, Kavanagh, Kevin D., Pedregosa-Gutierrez, Jofre orcid logoORCID: 0000-0001-7527-4522, Yeates, Patrick orcid logoORCID: 0000-0002-6734-0590, Kennedy, Eugene T. orcid logoORCID: 0000-0002-0710-5281 and Costello, John T. orcid logoORCID: 0000-0003-4677-9999 (2007) Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses. Applied Physics Letters, 90 (13). ISSN 0003-6951

Abstract
Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) Free electron LASer in Hamburg and an independent intense 120 fs mode-locked Ti:Sa laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs r.m.s. jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.
Metadata
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:short wavelength radiation; two-color above threshold ionization;
Subjects:Physical Sciences > Spectrum analysis
Physical Sciences > Physics
Physical Sciences > Lasers
Physical Sciences > Photonics
DCU Faculties and Centres:Research Institutes and Centres > National Centre for Plasma Science and Technology (NCPST)
DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Publisher:American Institute of Physics
Official URL:http://dx.doi.org/10.1063/1.2716360
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:74
Deposited On:03 May 2007 by DORAS Administrator . Last Modified 07 Oct 2021 12:50
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