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Reducing day-level emotional exhaustion: The complementary role of high involvement work systems and engaging leadership

Kilroy, Steven orcid logoORCID: 0000-0002-5221-2131, Fu, Na orcid logoORCID: 0000-0003-2507-0585, Bosak, Janine orcid logoORCID: 0000-0001-5701-6538, Hayes, Richard and Schaufeli, Wilmar orcid logoORCID: 0000-0002-6070-7150 (2023) Reducing day-level emotional exhaustion: The complementary role of high involvement work systems and engaging leadership. Human Resource Management Journal, 33 (4). pp. 846-867. ISSN 1748-8583

Abstract
High involvement work systems (HIWS) have been found to be improve employee well-being. The underlying processes through which HIWS influence employee well-being and the conditions under which these practices work are not fully understood. This study draws on job demands-resources theory to address this gap by theorising two novel mediators, that is, work pressure and bonding social capital, to explain how HIWS influence emotional exhaustion. We further proposed that engaging leadership as a proxy of line manager implementation of HIWS would strengthen these relationships. An integrated model is presented on how, why, and when HIWS influence employee well-being. Using data collected from 97 employees in a pharmaceutical company via a general survey and then a diary survey for 5 working days, this study found that HIWS alleviated day-level emotional exhaustion through their experience of higher day-level bonding social capital and lower day-level work pressure and these relationships were stronger under high level of engaging leadership.
Metadata
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:High-involvement work practices, engaging leadership, well-being, emotional exhaustion, bonding social capital, work pressure, diary study
Subjects:Business > Management
Business > Employee attitudes
Business > Workplace stress
DCU Faculties and Centres:DCU Faculties and Schools > DCU Business School
Publisher:John Wiley & Sons Ltd.
Official URL:https://onlinelibrary.wiley.com/doi/abs/10.1111/17...
Copyright Information:Authors
ID Code:32720
Deposited On:02 Jun 2026 14:40 by Tam Nguyen . Last Modified 02 Jun 2026 14:40
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